Lucille A. Giannuzzi, Ph.D.
President
Lucille A. Giannuzzi holds a B.E. in Engineering Science and an M.S. in Materials Science and Engineering from SUNY Stony Brook and is currently Adjunct Professor at Stony Brook. She received her Ph.D. from The Pennsylvania State University in Metals Science and Engineering. Dr. Giannuzzi joined the Department of Mechanical Materials & Aerospace Engineering at the University of Central Florida in 1994 as an Assistant Professor where she was founding Director of the Materials Characterization Facility and an NSF CAREER award recipient. In her short time at UCF she achieved tenure and was promoted to Full Professor, acquiring over $6M in research funding. Dr. Giannuzzi has extensive experience in focused ion beam (FIB), scanning electron, and transmission electron microscopy (SEM, S/TEM), with applications in both the physical and life sciences. She was instrumental in developing the site-specific in-situ and ex-situ FIB lift-out techniques for S/TEM analysis. She joined FEI Company in 2003 and was a Product Marketing Engineer for FIB/SEM until 2010 where she helped to pioneer low energy ion milling techniques to minimize implantation damage in materials. Dr. Giannuzzi has also studied ion induced X-Rays and ion and electron induced imaging contrast mechanisms. She has also applied FIB specimen preparation techniques for electron backscatter diffraction (EBSD), FIB/SIMS, and used FIB-based specimen preparation methods for 2D and 3D characterization. Her expertise in charged particle-solid interactions also includes ion channeling, sputtering phenomena, and redeposition behavior. She has co-developed and delivered FIB-related lectures/short courses at UCF, Lehigh Microscopy School, ASU Winter School on High Resolution Microscopy, University of Michigan, and Microscopy & Microanalysis. Dr. Giannuzzi has applied FIB/SEM/TEM techniques to study the structure/property relationships in metals, alloys, ceramics, composites, polymers, minerals, bone/dental implants, inorganic, and biological samples. She maintains professional affiliations in AVS, ACerS, ASM Intl., TMS, MRS, MSA, and MAS and is a Fellow of AVS. She has been on the editorial board of the journal Microscopy and Microanalysis, and on the board of the Microanalysis Society, currently holding the position of Sustaining Member Chair for MAS. Dr. Giannuzzi has over 100 (co)authored publications, has contributed to several invited book chapters, and is co-editor of a book entitled “Introduction to Focused Ion Beams.”
