L.A. Giannuzzi & Associates LLC
12580 Walden Run Dr
Fort Myers , FL 33913 USA
mobile: +1-321-663-3806
fax: +1-321-413-0251
info@LAGiannuzzi.com
mobile: +1-321-663-3806
fax: +1-321-413-0251
info@LAGiannuzzi.com
Publications
Refereed Journal Articles: (49)
49. “Non-monotonic material contrast in scanning ion and scanning electron images,” L.A. Giannuzzi, M. Utlaut, Ultramicroscopy, 11, (2011), pp. 1564-1573, doi:10.1016/j.ultramic.2011.08.016 48. “FIB Induced X-rays (FIBIX) Using 30 keV Ga+ Ions,” Lucille A. Giannuzzi and Brian P. Gorman, J. Phys. Chem. C, 2010, 114 (12), pp 5551–5554. DOI: 10.1021/jp906224b 47. “Particle-Induced X-Ray Emission in Stainless Steel Using 30 keV Ga+ Focused Ion Beams,” Lucille A. Giannuzzi and Brian P. Gorman, Journal of Vacuum Science & Technology A (Vol.27, No.4), (2009) 668-671. http://link.aip.org/link/?JVA/27/668 DOI: 10.1116/1.3136852 46. “Trench Formation and Lateral Damage Induced by Gallium Milling of Silicon,” M. F. Russo Jr., M. Maazouz, L. A. Giannuzzi, C. Chandler, M. Utlaut, B. J. Garrison, Appl. Surf. Sci., 255 (2008) 828-830. DOI:10.1016/j.apsusc.2008.05.083. 45. “High-Temperature Interface Superconductivity Between Metallic and Insulating Copper Oxides,” A. Gozar, G. Logvenov, L. Fitting Kourkoutis, A. T. Bollinger, L. A. Giannuzzi, D. A. Muller & I. Bozovic, Nature 455, 782-785 (9 October 2008) doi:10.1038/nature07293 44. “Gallium Induced Milling of Silicon: A Computational Investigation of Focused Ion Beams,” M. F. Russo Jr., M. Maazouz, L. A. Giannuzzi, C. Chandler, M. Utlaut, C. Chandler, B. J. Garrison, Microscopy and Microanalysis, 14, (2008) 315-320. 43. “Molecular Dynamics Simulations of 30 keV and 2 keV Ga in Si,” 42. “Coatings and Joining for SiC and SiC-Composites for Nuclear Energy Systems,” C.H. Henager Jr., Y. Shin, L.A. Giannuzzi, B.W. Kempshall and S.M. Schwarz, Journal of Nuclear Materials, Volumes 367-370, Part 2, 1 August 2007, Pages 1139-1143. 41. “TEM Sample Preparation and FIB Induced Damage,” Joachim Mayer, Lucille Giannuzzi, Takeo Kamino, Joseph Michael, MRS Bulletin, 32 (2007) 400-407. (invited article) 40. “2D and 3D Analysis of Bone/Dental Implant Interfaces Using Focused Ion Beam and Electron Microscopy Techniques,” Lucille A. Giannuzzi, Daniel Phifer, Nicholas J. Giannuzzi, and Mario J. Capuano, Journal of Maxillofacial Surgery, April 65:4 (2007) 737-747. 39. “Electron-beam induced Recrystallization in Amorphous Apatite,” In-Tae Bae, Yanwen Zhang, William Weber, Mikio Higuchi, 38. “Site-specific 3D Imaging of Cells and Tissues with a Dual Beam Microscope,” Jurgen A.W. Heymann, Mike Hayles, Ingo Gestmann, 37. “Particle-Induced X-Ray Analysis Using Focused Ion Beams,” Lucille A. Giannuzzi, SCANNING, 27 (2005) 165-169. 36. “Phase Transformation of Thermally Grown Oxide on (Ni,Pt)Al Bond Coat During Electron Beam Physical Vapor Deposition and Subsequent Oxidation,” S. Laxman, B. Franke, B.W. Kempshall, Y.H. Sohn , L.A. Giannuzzi, K.S. Murphy, Surface and Coatings Technology , 177-178 (2004) 121-130. 35. “Grain structure of thin electrodeposited and rolled copper foils,” H.D. Merchant, W.C. Liu, L.A. Giannuzzi, and J.G. Morris, Materials Characterization, 53 (2004) 335-360. 34. “Effects of Diffusion Induced Recrystallization on the Volume Diffusion in the Copper-Nickel System,” S.M. Schwarz, B.W. Kempshall, and L.A. Giannuzzi, Acta Materialia, v. 51, n. 10, Jun 11 (2003), p. 2765-2776. 33. “The Correlation Between Ion Beam/Material Interactions and Practical FIB Specimen Preparation,” B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, R.B. Irwin, F.A. Stevie, Microscopy and Microanalysis, 9, (2003), 216-236. 32. “XPS Analysis of Si Samples Prepared by the FIB Lift-out Technique,” A.C. Ferryman, J.E. Fulghum, L.A. Giannuzzi, and F.A, Stevie, Surface and Interface Analysis, 33:12 (2002) 907-913. 31. “Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system,” S.M. Schwarz, B.W. Kempshall, F.A. Stevie, and L.A. Giannuzzi, Acta Materialia, 50, (2002) 5079-5084. 30. “Grain Boundary Segregation: Equilibrium and Non-Equilibrium Conditions,” B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, and L.A. Giannuzzi, Scripta Materialia, 47 (7), (2002), 447-451. 29. “Hydrogen Uptake Characteristics of Mechanically Alloyed Mixtures of Ti-Mg-Ni,” J.K. Lomness, M.D. Hampton, and L.A. Giannuzzi, International Journal of Hydrogen Energy, 27 (2002) 915-920. 28. “Phase Distribution in, and Origin of, Interfacial Protrusions in Ni-Cr-Al-Y/Zr02 Thermal Barrier Coatings,” Altaf H. Carim, Tabbetha A. Dobbins, Lucille A. Giannuzzi, Donald A. Koss, David R. Arenas, and Merrilea J. Mayo, Materials Science and Engineering, A334 (2002) 65-72. 27. “EBSP Investigation of Focused Ion Beam Surfaces,” T.L. Matteson, B.W. Kempshall, S.W. Schwarz, E.C. Houge, and L.A. Giannuzzi, Journal of Electronic Materials, 31(1), (2002), 33-39. 26. “A Comparative Evaluation of FIB CVD Processes,” B.W. Kempshall , B.I. Prenitzer, L.A. Giannuzzi, F.A. Stevie, and S.X. Da, Journal of Vacuum Science & Technology B, 20(1), Jan/Feb, (2002), 286-290. 25. “Surface Study of Liquid Water Treated and Water Vapor Treated Mg2.35Ni Alloy,” M.D. Hampton, J.K. Lomness, and L.A. Giannuzzi, International Journal of Hydrogen Energy, 27 (2002) 79-83. 24. “Electrical Linewidth Test Structures Patterned in (100) Silicon-on-Insulator for Use as CD Standards,” Cresswell, M W ; Bonevich, J E ; Allen, R A ; Guillaume, N M P ; Giannuzzi, L A ; Everist, S C ; Murabito, C E ; Shea, P J ; Linholm, L W, IEEE Transactions on Semiconductor Manufacturing, 14, no. 4, (2001): 356-365. 23. “Focused Ion Beam Milling: A Method of Site-Specific Sample Extraction for Microanalysis of Earth Materials,” Peter J. Heaney, Edward P. Vicenzi, Lucille A. Giannuzzi, and Kenneth J.T. Livi, American Mineralogist, 86, (2001), 1094-1099. 22. “Site-Specific Transmission Electron Microscope Characterization of Micrometer-Sized Particles Using the Focused Ion Beam Lift-Out Technique,” Janice K. Lomness, Lucille A. Giannuzzi, and Michael D. Hampton, Microscopy and Microanalysis, 7, (2001), 418-423. Figure 1 from this article was chosen as the cover art for this issue of the journal. 21. “Ion Channeling Effects on the FIB Milling of Copper,” B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, Journal of Vacuum Science & Technology B, 19(3), May/Jun, (2001), 749-754. 20. “Application of Focused Ion Beam Lift-Out Specimen Preparation To TEM, SEM, STEM, AES, and SIMS Analysis,” F.A. Stevie, C.B. Vartuli, L.A. Giannuzzi, T. L. Shofner, S. R. Brown, B. Rossie, F. Hillion, R. H. Mills, M. Antonell, R.B. Irwin, and B. M. Purcell, Surface Interface Analysis, (2001), 31, 345-351. 19. “Growth And Characterization Of Bulk Copper Bicrystal Twist Boundaries,” S.M. Schwarz, E.C. Houge, L.A. Giannuzzi, and A.H. King, Journal of Crystal Growth, Vol. 222, nos. 1,2, January 1, 2001, pp. 392-398. 18. “Focused Ion Beam/ Lift-Out TEM Cross Sections of Block Copolymer Films Ordered on Silicon Substrates,” H. J. White, Y. Pu, M. Rafailovich, J. Sokolov, A. H. King, L. A. Giannuzzi, C. Urbanik-Shannon, B.W. Kempshall, A. Eisenberg, S. A. Schwarz, Y. M. Strzhemechny, Polymer, v 42 n 4 Feb (2000). p 1613-1619. 17. “Metallurgy and performance of electrodeposited copper for flexible circuits,” H.D. Merchant, J.T. Wang, L.A. Giannuzzi, Y.L. Liu, Circuit World, vol. 26, No. 4, September (2000), p. 7-14. 16. “Using a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures,” Lucille A. Giannuzzi, Richard Young, Pete Carleson, 15. “Wet Thermal Oxidation of GaN,” E.D. Readinger, S.D. Wolter, D.L. Waltemyer, J.M. Delucca, S.E. Mohney, B.I. Prenitzer, L.A. Giannuzzi, and R.J. Molnar, Journal of Electronic Materials, Vol. 28, No. 3, (1999), p. 257-260. 14. “Focused Ion Beam Milling for TEM Specimen Preparation,” L.A. Giannuzzi and F.A. Stevie, Micron, vol, 30, No. 3, (1999) p. 197-204. 13. “Electron Microscopy Sample Preparation For the Biological and Physical Sciences Using Focused Ion Beams,” L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, T.L. Shofner, S.R. Brown, R.B. Irwin, F.A. Stevie, Journal of Process Analytical Chemistry, vol. IV, No. 3,4, (1999) p. 162-167. Figure 2 from this article was chosen as the cover art for this issue of the journal. 12. “High-Temperature Creep and Microstructural Evolution of Chemically Vapor-Deposited Silicon Carbide Fibers,” C.A. Lewinsohn, L.A. Giannuzzi, C.E. Bakis, and R.E. Tressler, Journal of the American Ceramic Society, 82 [2], 407-413 (1999). 11. “Transmission Electron Microscope Specimen Preparation of Zn Powders Using the Focused Ion Beam Lift-Out Technique” B.I. Prenitzer, L.A. Giannuzzi, K. Newman, S.R. Brown, T.L. Shofner, R.B. Irwin, F.A. Stevie, Metallurgical and Materials Transactions A., SEP 01 (1998) v 29 n 9, P. 2399-2406. 10. “Applications of the FIB Lift-Out Technique,” L.A. Giannuzzi, J.L. Drown, S.R. Brown, R.B. Irwin, F.A. Stevie, Microscopy Research and Technique, 41:285-290 (1998). 9. “Microstructural Development of SCS-6 SiC Fibers During High Temperature Creep,” L.A. Giannuzzi, C.A. Lewinsohn, C.E. Bakis, and R.E. Tressler, Journal of Materials Research. v 13 n 7 Jul (1998) p 1853-1860. 8. “TEM/EELS Characterization of a Sintered Polycrystalline Silicon Carbide Fiber,” X. Tenailleau, Xavier Bourrat, Roger Naslain, Richard E. Tressler, Lucille A. Giannuzzi, Journal of the American Ceramic Society, 81, [8], 2037-44 (1998). 7. “Discussion of 'The Effect of Steel Chemistry on the Formation of Fe-Zn Intermetallic Compounds of Galvanneal-Coated Steel Sheets',” Lucille A. Giannuzzi, Paul R. Howell, William R. Bitler, Metallurgical and Materials Transactions B, 27B (1996), 146-147. 6. “High Resolution Electron Microscopy of the Iron-Zinc Delta Intermetallic Phase,” L.A. Giannuzzi, A. S. Ramani, P.R. Howell, H.W. Pickering, W.R. Bitler, Plating and Surface Finishing, 80, [2], (1993), 54. 5. “Transmission Electron Microscopy of Electrodeposits,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, Journal of Electronic Materials, 22, [6], (1993), 639. 4. “Techniques for the Production of Thin Foils From the Interfacial Regions of Iron-Zinc Couples,” 3. “Diffusion Induced Recrystallization During Ion Beam Milling,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, Scripta Metallurgica et Materialia, 24, (1990), 2407. 2. “On the Origin of Deformation Twinning in Electrodeposits and the Phenomenon of Cross-Twinning,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, Scripta Metallurgica, 23, (1989), 1353. 1. “Grain Boundary Viscosity at High Temperatures and the Grain Boundary Phase Transformation,” L.A. Giannuzzi and A.H. King, Scripta Metallurgica, 19, (1985), 281.
Referred Conference Proceedings: (30)
1. “Interfacial Characterization of Zinc-Coated Steels by Transmission Electron Microscopy-A Preliminary Study,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, in Zinc-Based Steel Coating Systems: Metallurgy and Performance, eds. G. Krauss and D.K. Matlock, TMS, (1990), 121.
2. “A Preliminary Characterization of the Defect Structure of the Zeta Phase in the Interfacial Region of Fe-Zn Couples,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, in Structure/Property Relationships for Metal/Metal Interfaces, eds. A.D. Romig Jr., D.E. Fowler, P.D. Bristowe, Materials Research Society, 229, (1991), 233.
3. “Preparation of Cross-Sectional TEM Samples of Fe-Zn Couples,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, in Specimen Preparation for Transmission Electron Microscopy of Materials-III, eds. Ron Anderson, Bryan Tracy, and John Bravman, Materials Research Society, 254, (1992), 159.
4. “The Characterization of Intermediate Phases of Electrogalvanized-Iron Couples by Cross-Section Transmission Electron Microscopy - A Brief Overview,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, and W.R. Bitler, in Galvatech '92, Proc. 2nd International Conference on Zinc and Zinc Alloy Coated Steel Sheet, Amsterdam, Netherlands, 8-10 Sept. 1992, 461-467.
5. “Transmission Electron Microscopy of the Interdiffusion Regions of Iron-Zinc Couples,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, in Metallography: Past, Present, and Future (75th Anniversary Volume), eds. G.F. Vander Voort, F.J. Warmuth, S.M. Purdy, and A. Szirmae, American Society for Testing and Materials, (1993), 212-223.
6. “High Temperature Strength and Creep Behavior of Carborundum Alpha Silicon Carbide Fibers,” L.A. Giannuzzi, K.L. Rugg, and R.E. Tressler, Ceramic Transactions, 38, Advances in Ceramic-Matrix Composites, ed. Narattam P. Bansal, The American Ceramic Society, Westerville, OH, (1993), 655-666.
7. “The Time Dependent High Temperature Mechanical Behavior of Polycrystalline Alpha-SiC Fibers,” K.L. Rugg, L.A. Giannuzzi, and R.E. Tressler, Ceramic Transactions, vol. 46, Advances in Ceramic-Matrix Composites II, ed. Narattam P. Bansal, The American Ceramic Society, Westerville, OH, (1994), 29-40.
8. "Cross Section TEM of Electrodeposited Pd Films," L.A. Giannuzzi, Microstructural Science, 24, eds. M.G. Burke, E.A. Clark, E.J. Palmiere, ASM International, (1997), 87-91.
9. “Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section TEM Specimen Preparation,"
10. “On the use of Energy-Dispersive Spectroscopy (EDS) for Copper Loss Mapping in Copper Infiltrated Tungsten (CIT) Jet Vanes,” J.G. McCarthy, L.A. Giannuzzi, C.P. Rahaim, Proc. of the 4th Int. Conf. On Tungsten Refractory Metals and Alloys,
11. “Plan View Sample Preparation Using the Focused Ion Beam Lift Out Technique,” F.A. Stevie, R.B. Irwin, T.L. Shofner, S.R. Brown, J.L. Drown, and L.A. Giannuzzi, Proceedings of the 1998 International Conference on Characterization and Metrology of ULSI Technology, vol. 449, Gaithersburg, MD, March 23-27, 1998, eds. DG Seiler, AC Diebold, WM Bullis, TG Shaffner, R. McDonald, EJ Walters, pp 868-71.
12. “Advances in the FIB Lift-Out Technique for TEM Specimen Preparation: HREM Lattice Imaging,” L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, S.R. Brown, R.B. Irwin, and F.A. Stevie, T.L. Shofner, Microstructural Science, Volume 26, The 31st Annual Technical Meeting of the International Metallographical Society, (1999), 249-253.
13. “Interphase Oxidation In SIC/SIC Composites At Varying Partial Pressures Of Oxygen,” L.A. Giannuzzi and C. A. Lewinsohn, 23rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B, Ceramic Engineering and Science Proceedings, eds. Ersan Ustundag and Gary Fischman, Vol. 20, Issue 4, pp. 115-122, (1999).
14. “Microstructural Evaluation of SIMS Crater Roughening,” B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, in Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertand, H.-N. Migeon and H.W. Werner, 2000, Elsevier, Proceedings of the 12th Annual Conference on Secondary Ion Mass Spectrometry ,
15. “Interphase Oxidation in SiC/SiC Composites,” L.A. Giannuzzi and C. A. Lewinsohn, 24rd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A, Ceramic Engineering and Science Proceedings, eds. Todd Jansen, Ersan Ustundag, Vol. 21, Issue 3, pp. 469-477, (2000).
16. “Comparison of electrical CD measurements and cross-section lattice-plane counts of sub-micrometer features replicated in (100) silicon-on-insulator material ,” Cresswell, Michael W., Bonevich, John E., Headley, Thomas J., Allen, Richard A.,
17. Michael D. Hampton, Janice K. Lomnessd, and Lucille Giannuzzi, “The Role of Water in the Storage of Hydrogen in Metals”, 2000 Research Reports, NASA/ASEE Summer Faculty Fellowship Program, NASA CR-2001-210260, E. Ramon Hosler and G. Buckingham Editors, Nov. 2000, pp. 63.
18. “Interfacial Microstructure For As-Deposited And Cycled-To-Failure Thermal Barrier Coatings,” Altaf H. Carim, Tabbetha A. Dobbins, Merrilea J. Mayo, and Lucille A. Giannuzzi, in Elevated Temperature Coatings: Science and Technology IV, N. B. Dahotre, J. M. Hampikian, and J. E. Morral, eds. (TMS, Warrendale, PA, 2001), pp. 45-59 (130th Annual Meeting of The Minerals, Metals, and Materials Society, New Orleans, LA, February 11-15, 2001). (CD-ROM distribution only; portable document format.)
19. “Characterization of Photo-thermal refractive glasses,” H. Francois St Cyr, K. Elshot, L. Giannuzzi, K. A. Richardson, F. Stevie, X. Bourrat and P. LeCoustumer, paper # K6.2b, Microphotonics, Materials, Physics and Applications, Fall meeting of the MRS 25-29; November 2001 (Boston, MA)
20. “Fiber-Reinforced Composites: C and SiC Fibers - Oxidation Effects - Crack Growth Behavior and TEM Analysis of Interphase Oxidation in Boron-Enhanced SiC/SiC Composites,” L.A. Giannuzzi and C. A. Lewinsohn, Ceramic engineering and science proceedings. 22, no. 3, (2001): 617-624 American Ceramic Society.
21. “FIB/TEM analysis of paint layers from Thomas Eakins’ The Crucifixion, 1880,” Lins, Andrew;
22. Y.H. Sohn , B.W. Kempshall, V.H. Desai and L.A. Giannuzzi, “Assessment of Failure Mechanisms for Thermal Barrier Coatings by Photoluminescence, Electrochemical Impedance and Focused Ion Beam”, Proceedings of the 2003 High Efficiency Engines and Turbines (HEET) Materials Workshop III, pp. 52-74, (November, 2002).
23. “Ni Diffusion in (100) Cu Twist Boundaries,” S.M. Schwarz, B.W. Kempshall, and L.A. Giannuzzi, Mass and Charge Transport in Inorganic Materials - II, Proceedings of the 2nd International Conference "Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices" of the Forum on New Materials, part of CIMTEC 2002-10th International Ceramics Congress and 3rd Forum on New Materials, held in Florence, July 14-18, 2002, Vol.37 Advances in Science and Technology (2003) pp 231-238
24. “Ni Diffusion in Bi Segregated (100) Cu Twist Grain Boundaries,” B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, Mass and Charge Transport in Inorganic Materials - II, Proceedings of the 2nd International Conference "Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices" of the Forum on New Materials, part of CIMTEC 2002-10th International Ceramics Congress and 3rd Forum on New Materials, held in Florence, July 14-18, 2002, Vol.37 Advances in Science and Technology (2003) pp239-248
25. “Hydrogen Storage In Titanium-Magnesium-Nickel Mixtures,” J.L. Lomness, M.D. Hampton, and L.A. Giannuzzi, Materials Research Society Symposium - Proceedings v 753 2003 p 541-546.
26. “Phase Transformation of Thermally Grown Oxide on (Ni,Pt)Al Bond Coat During Electron Beam Physical Vapor Deposition and Subsequent Oxidation,” S. Laxman, B. Franke, B.W. Kempshall, Y.H. Sohn, L.A. Giannuzzi, K.S. Murphy, in press, Proceedings of the 2003 International Conference on Metallurgical Coatings and Thin Films – ICMCTF, April 26-May2, 2003, San Diego, CA, USA.
27. S. Laxman, B. Franke, L.A. Giannuzzi, Y.H. Sohn , K.S. Murphy, “Phase Transformation of Thermally Grown Oxide on (Ni,Pt)Al Bond Coat During Electron Beam Physical Vapor Deposition and Subsequent Oxidation,” Proceedings of the 2003 International Conference on Metallurgical Coatings and Thin Films - ICMCTF, eds. A. Mathews, K. Marchev, J. Patscheider, Y. Pauleau, Elsevier, pp. 121-130 (2004).
28. “Optimization of Nanomachining Using Focused Ion Beams,” Lucille A. Giannuzzi, Paul Anzalone, Daniel Phifer, in NSTI-Nanotech, Vol 2. (2005), 683-686.
29. “Focused Ion Beam Study of Ni5Al Single Splat Microstructure,” Yuhong Wu, Meng Qu,
30. “Recent Advances in FIB Technology For Nano-Prototyping and Nano-Characterisation,” DJ Stokes, L Roussel, O
Referred Extended Abstracts (2 or more published pages): (54)
1. “Structural Changes in Pd Electrodeposits During TEM Sample Preparation,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, Electron Microscopy 1990, 4, eds. L.D. Peachy and D.B. Williams, Proceedings of the XIIth Int. Congress for Electron Microscopy, San Francisco Press, (1990), 1008.
2. “On the Recrystallization of Electrodeposited Zinc During Mechanical Polishing to Electron Transparency,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, Proceedings of the 49th Annual Meeting of the Electron Microscopy Society of America, San Francisco Press, (1991), 1106.
3. “New Phases in the Al-Co-Cu Alloy System: Marked Variations From the 'True' Decagonal Phase,” A.S. Ramani, L. A. Giannuzzi, A.H. Carim, W.R. Bitler, P.R. Howell, in Proc. 50th Annual Meeting of the Electron Microscopy Society of America, eds. G.W. Bailey, J. Bently, and J.A. Small, San Francisco Press, (1992), 32.
4. “Observation of Pseudo 10-Fold Symmetry in the Ordered Iron-Zinc Delta Phase,” L.A. Giannuzzi, A.S. Ramani, P.R. Howell, H.W. Pickering, W.R. Bitler, in Proc. 50th Annual Meeting of the Electron Microscopy Society of America, eds. G.W. Bailey, J. Bently, and J.A. Small, San Francisco Press, (1992), 36.
5. “TEM of Grain Growth and Phase Transformations During Creep of SCS-6 Silicon Carbide Fibers,” L.A. Giannuzzi, C.A. Lewinsohn, C.E. Bakis, and R.E. Tressler, Proc. Microscopy and Microanalysis 1995, eds. G.W. Bailey, M.H. Ellisman, R.A. Hennigar, and N.J. Zaluzec, (1995), Jones and Begall Publishing, NY, 350-351.
6. “Focused Ion Beam Milling for Site Specific Scanning and Transmission Electron Microscopy of Materials,” L.A. Giannuzzi, J.L. Drown, S.R. Brown, R.B. Irwin, F.A. Stevie, Microscopy and Microanalysis, vol. 3 suppplement 2, (1997), 347-8.
7. “Comparison of Sputtered Titanium Nitride on Silicon Dioxide and Aluminum-Alloy Thin Films,” J.L. Drown, S.M. Merchant, M.E. Gross, D. Eaglesham, L.A. Giannuzzi, R.B. Irwin, Microscopy and Microanalysis, vol. 3 suppplement 2, (1997), 469-70.
8. “Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation between Monte Carlo Based Simulation and Empirical Results,” B.I. Prenitzer, L. A. Giannuzzi, S. R. Brown, R. B. Irwin, T. L. Shofner, and F. A. Stevie, Microscopy and Microanalysis 1998 Proceedings, Microscopy Society of America, Springer p. 858-859 (1998).
9. “The Influence of Incident Ion Range on the Efficiency of TEM and SEM Specimen Preparation of Focused Ion Beam Milling,” B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F.A. Stevie, Electron Microscopy 1998, ICEM14, Symposium K, Volume III, eds., H.A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol, (1998) 711-712.
10. “A Tutorial of the FIB Lift-Out Technique for TEM Specimen Preparation, Microscopy and Microanalysis,” Lucille A. Giannuzzi, vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 516-517.
11. “Characterization of FIB Damage in Silicon,” C.A. Urbanik, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossie, R.B. Irwin, and F.A. Stevie, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 740-741.
12. “The FIB Lift-Out Specimen Preparation Technique for TEM Analyses and Beyond: SEM, AUGER, STEM, and SIMS Applications,” F.A. Stevie, C.B. Vartuli, R.H. Mills, R.B. Irwin, T.L. Shofner, and L.A. Giannuzzi, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 888-889.
13. “TEM FIB Lift-Out Of Mount Saint Helens Volcanic Ash,” J. L. Drown-MacDonald, B. I. Prenitzer, T. L. Shofner+, and L. A. Giannuzzi, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 908-909.
14. “In-Situ Transformation of a Zinc TEM Lift-Out Specimen,” Microscopy and Microanalysis,” B.I. Prenitzer, S. Collins, and L.A. Giannuzzi, vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 928-929.
15. “The Effect of Milling Parameters on Aspect Ratios Attainable in FIB Milled Features,” B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, and F.A. Stevie, 12th Annual SIMS Workshop, April 1999, p 70-72.
16. “A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening,” L.A. Giannuzzi, B.W Kempshall, B.I. Prenitzer, J.M. McKinley, F. A. Stevie, 13th Annual SIMS Workshop 2000, April 30 – May 3, 2000, Lake Tahoe, NV, pp. 19-21.
17. “STEM analysis of FIB damage in Silicon,” C Urbanik Shannon , B I Prenitzer, L A Giannuzzi , S R Brown, T L Shofner, B Rossi, C A Vartuli, R B Irwin, F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 177-178.
18. “Effects of incident angle and target rotation on SIMS crater roughening,” L A Giannuzzi, B I Prenitzer, J M McKinley, and F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 353-354.
19. “Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions,” B. I. Prenitzer, B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 502-503 (2000).
20. “Revisiting The FIB Tem Lift-Out Specimen Preparation Technique,” L. A. Giannuzzi and F. A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of
21. “Site Specific Tem Analysis Of Micrometer-Sized Particles With The FIB Lift-Out Technique,” J. K. Lomness, L. A. Giannuzzi, and M. D. Hampton, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of
22. “Microstructural Characterization Of Automated Specimen Preparation For TEM Analysis,” C. Urbanik Shannon, L. A. Giannuzzi and E. M. Raz, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of
23. “Calibration Method for Elemental Quantification,” C. B. Vartuli, F. A. Stevie, L. A. Giannuzzi, T. L. Shofner, B. M. Purcell, R. B. Irwin, J.M. McKinley and R. J. Wesson, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 536-537 (2000).
24. “Diffusion of Ion Implanted Elements in Silicon by TEM and SIMS,” R.R. Vanfleet, H. Francois-Saint-Cyr, F. Stevie, L. Giannuzzi, R. Irwin, B. Kempshall, T. Shofner, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 1082-1083 (2000).
25. “TEM Specimen Preparation Techniques and Analysis of Photo-Thermo-Refractive Glasses (PTRG),” H. Francois-Saint-Cyr, K. Elshot, P. Le Coustumer, X. Bourrat, K. Richardson, L. Giannuzzi, L. Glebov, L. Glebova, F. Stevie, Microsc. Microanal., 7 (Suppl 2: Proceedings), Microscopy Society of
26. “FIB/SEM Dual Beam Instrumentation: Slicing, Dicing, Imaging, and More,” Lucille A. Giannuzzi, Microsc. Microanal., 7 (Suppl 2: Proceedings), Microscopy Society of
27. “Applications of the FIB Lift-Out Technique for the TEM of Cold Worked Fracture Surfaces,” Lucille A. Giannuzzi, Henry J. White, Wayne C. Chen, Microsc. Microanal., 7 (Suppl 2: Proceedings), Microscopy Society of
28. “TEM of Sub-Micrometer Particles Using the FIB Lift-Out Technique,” Lanice K. Lomness, Brian W. Kempshall, Lucille A. Giannuzzi, Mark B. Watson, Microsc. Microanal., 7 (Suppl 2: Proceedings), Microscopy Society of
29. “Use of SIMS to Determine Grain Boundary Diffusion,” S.M. Schwarz, B.W. Kempshall, L.A. Giannuzzi, and F.A. Stevie, 15th Annual Workshop on SIMS, Clearwater, FL, April 29 – May 2, 2002, International.
30. “Automated Crystallography and Grain Mapping in the TEM,” F. Bo Clayton, Brian W. Kempshall, Stephen M. Schwarz, and Lucille A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 656-657CD.
31. “In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials,” B.W. Kempshall and
32. “FIB Damage in Silicon: Amorphization or Redeposition?,” S. Rajsiri, B. W. Kempshall, S.M. Schwarz, and L. A. Giannuzzi, Microscopy and Microanalysis, 8 (Suppl. 2), (2002), 50-51.
33. “In-Situ FIB Lift-Out For Site Specific Tem Specimen Preparation Of Grain Boundaries And Interfaces,” B.W. Kempshall, S.M. Schwarz, and
34. “Avoiding the Curtaining Effect: Backside Milling by FIB INLO,” Stephen M. Schwarz, Brian W. Kempshall, Lucille A. Giannuzzi, and Molly R. McCartney, in press, Microscopy and Microanalysis, 9 (Suppl 2), (2003), 116-117.
35. “Multiple Analytical Instrumentation for Complete Materials Characterization,” Stephen M. Schwarz, Brian W. Kempshall, Lucille A. Giannuzzi, and Fred A. Stevie, in press, Microscopy and Microanalysis, 9 (Suppl 2), (2003), 256-257.
36. “TEM Specimen Preparation for the Physical Sciences,” Lucille A. Giannuzzi, Scott D. Walck, and Ron Anderson, in press, Microscopy and Microanalysis, August, 2003.
37. “Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography,” M.R. McCartney, Jing Li, Partha Chakraborty,
38. “DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning,” P.A. Anzalone, J.R.
39. “FIB Specimen Preparation for STEM and EFTEM Tomography,” S.M. Schwarz and
40. “2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon,” Lucille A. Giannuzzi, Remco Geurts, and Jan Ringnalda, Microscopy and Microanalysis, 11 (Suppl 2), (2005) 828-829.
41. “FIB, SEM, and TEM of Bone/Dental Implant Interfaces,” Lucille A. Giannuzzi, Nicholas J. Giannuzzi, and Mario J. Capuano, Microscopy and Microanalysis, 11 (Suppl 2), (2005) 998-999.
42. “Focused Ion Beam Induced X-Ray Analysis,” Lucille A. Giannuzzi, Microscopy and Microanalysis, 11 (Suppl 2), (2005) 1348-1349.
43. “Reducing FIB Damage Using Low Energy Ions, Lucille A. Giannuzzi, Microscopy and Microanalysis, 12 (Suppl 2), (2006) 1260CD-1261CD.
44. “Circumferential FIB Milling for Lift-Out Specimens,”
45. “Improved EBSD Sample Preparation Via Low
46. “Computed Tomographic Spectral Imaging: 3D STEM-EDS Spectral Imaging,” P.G. Kotula, L.N. Brewer, J.R. Michael,
47. “Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si,
48. “Static vs. Dynamic FIB/SEM Methods For 3D Modeling,” B. Van Leer and L. Giannuzzi, Microscopy and Microanalysis (2007), 13(Suppl 2):1506-1507CD Cambridge University Press Microscopy Society of America, doi:10.1017/S1431927607071632
49. “Advances in TEM Sample Preparation Using a Focused Ion Beam,” B Van Leer and LA Giannuzzi, Microscopy and Microanalysis (2008), 14:380-381CD Cambridge University Press, Microscopy Society of America, doi:10.1017/S1431927608086030.
50. “Relative Contrast in Ion and Electron Induced Secondary Electron Images,” LA Giannuzzi, M Utlaut and M Scheinfein, Microscopy and Microanalysis (2008), 14:1188-1189CD, Cambridge University Press, Microscopy Society of America doi:10.1017/S1431927608088685.
51. “Contrast in Ion Induced Secondary Electron Images,” Lucille A. Giannuzzi, Mark Utlaut, and
52. “Protective Carbon Deposition for
53. “Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images,” Lucille A. Giannuzzi and M. Utlaut, Microsc Microanal 15(Suppl 2), 2009, 650-651. doi: 10.1017/S1431927609093982
54. “30 keV
Non-Referred Conference Proceedings and/or Extended Abstracts: (9)
1. “Factors Affecting Low Temperature Interdiffusion,”
2. “TEM Observations of Twin Structures in Electrodeposits,”
3. “Interfacial Phenomena in the Iron-Zinc System,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, SUR/FIN '90 Conference Proceedings, Boston, MA, AESF, (1990), 381.
4. “Transmission Electron Microscopy of Iron-Zinc Couples,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, W.R. Bitler, SUR/FIN '91 Conference Proceedings, Toronto, Canada, AESF, (1991), 927.
5. “A Microstructural Evaluation of Fe-Zn Couples by Cross-Section Transmission Electron Microscopy,” L.A. Giannuzzi, P.R. Howell, H.W. Pickering, and W.R. Bitler, SUR/FIN '92 Conference Proceedings, Atlanta, AESF, 1,43-51, (1992).
6. “The Creep Behavior of Polycrystalline Silicon Carbide Fibers,”
7. “Primary Creep of CVD Silicon Carbide Fibers,” C.A. Lewinsohn, L.A. Giannuzzi, C.E. Bakis, and R.E. Tressler, Proc. 7th Annual HITEMP Review, NASA CP-10146, 24-26 Oct. 1994, Cleveland, OH, pp. 75.1-75.11.
8. “Primary Creep of CVD Silicon Carbide Fibers,” C.A. Lewinsohn, L.A. Giannuzzi, C.E. Bakis, and R.E. Tressler, Proc. 7th Annual HITEMP Review, NASA CP-10146, 24-26 Oct. 1994, Cleveland, OH, pp. 75.1-75.11.
9. “The Role of TEM in the Characterization of Galvanized Steel,” L.A. Giannuzzi, P.R. Howell, and W.R. Bitler, 1996 AESF Continuous Steel Strip Plating Symposium, AESF (1996) , 91-96.
Books and/or Book Chapters/Special Articles (9)
1. S. Roberts, J. McCaffrey, L. Giannuzzi, F. Stevie and N. Zaluzec, “Advanced Techniques in TEM Specimen Preparation,” in Progress in Transmission Electron Microscopy 1-Concepts and Techniques, eds. X-F Zhang and Z. Zhang, Tsinghua University Press, Springer-Verlag, Berlin, (2001), 301-361.
2. “FIB Lift-Out for Defect Analysis,” Lucille A. Giannuzzi and Brian W. Kempshall, Shawn D. Anderson, Brenda I. Prenitzer, and Thomas M. Moore, in Analysis Techniques of Submicron Defects, 2002 Supplement to the EDFAS Failure Analysis Desktop Reference, ASM International, Materials Park, Ohio (2002), 29-35.
3. Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, and Fred A. Stevie, Springer, (2005).
4. “The Focused Ion Beam Instrument,” F.A Stevie,
5. “Ion-Solid Interactions,” Lucille A. Giannuzzi, Brenda I. Prenitzer, and Brian W. Kempshall, in Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, and Fred A. Stevie, Springer, (2005) 13-52.
6. “FIB Lift-Out Specimen Preparation Techniques: Ex-situ and In-Situ Methods,” L.A. Giannuzzi, B.W. Kempshall, S.M. Schwarz, J.K. Lomness, B.I. Prenitzer, and F.A. Stevie, in Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, and Fred A. Stevie, Springer, (2005), 201-228.
7. “Cs corrected quantitative HRTEM with 2 keV FIB specimen preparation,” Lucille A. Giannuzzi, Remco Geurts, and Jan Ringnalda, FEI NanoSolutions, July 01 (2005), p86-93.
8. “Applications of FIB and DualBeam for Nanofabrication,” by Brandon Van Leer, Lucille A. Giannuzzi, and Paul Anzalone, in Scanning Microscopy for Nanotechnology: Techniques and Applications, eds. Weilie Zhou and Zhong Lin Zhang, Springer, (2007) 225-236.
9. “Characterization Methods of FIB/SEM DualBeam Instrumentation,” Steven Reyntjens and
1. The Role of the Coincidence Site Lattice in Grain Boundary Engineering, Valerie Randle, Institute of Materials, 1996, ISBN 1-86125-006-1, review by
